1.
thin-film single junction quantum interferometer
薄膜单结量子干涉仪
2.
THE THICKNESS AND REFACTURE INDEX OF SINGLELAYER FILM MEASURED BY MICHELSON INTERFEROMETER
用迈克尔逊干涉仪测量单层薄膜的厚度和折射率
3.
Refractive Index and Thickness of Michelson Interferometer Measure Film;
迈克尔逊干涉仪测量薄膜的折射率与厚度
4.
superconducting quantum interference magnetometer
超导量子干涉磁力仪
5.
Effects of the Light Nonmonochromatic on Thin Film Interference Fringes;
光的非单色性对薄膜干涉条纹的影响
6.
Quantum Information Processing Via Mach-Zehnder Interferometer;
基于马赫—泽德干涉仪的量子信息处理
7.
Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry
基于白光干涉的光学薄膜物理厚度测量方法
8.
Measuring thin-film thickness with phase-shift interferometry
基于相位偏移干涉术的薄膜厚度测量方法
9.
interferometer-measuring refractive indices
测量折射率用干涉仪
10.
Along the length of the filter, the interference film looks like a wedge.
沿薄膜的长度方向看干涉膜似尖劈。
11.
Along the length of the filter, the interference film like a wedge.
沿薄膜的长度方向看干涉膜尖劈。
12.
three-crystal electron interferometer
三晶体的电子干涉仪
13.
Realization of GHZ and W Entangled States with Multiple Superconducting Quantum-Interference Device Qubits in Cavity QED;
在腔中实现超导量子干涉仪GHZ和W态的制备
14.
Cloning a State Near a Given One with Superconducting Quantum-interference Device
利用超导量子干涉仪实现近似给定态克隆(英文)
15.
Experimentally Study the Electromechanical Character of Quantum Well Thin Film Structure;
量子阱薄膜结构的机电特性实验研究
16.
Interference Filter of Reflectance in 650nm and Transmittance in 10.6μm;
650nm反射10.6μm透射的薄膜干涉滤光片
17.
Remote State Preparation with Superconducting Quantum Interference Devices in Cavity QED;
利用腔QED中的超导量子干涉仪实现量子态的远程制备
18.
A single moving observer passive localization method using LBI phase difference changing rate only
仅用长基线干涉仪测量相位差变化率的运动单站无源定位方法