1.
secondary ion mass spectroanalyzer
二次离子质谱分析器
2.
Studies of Vanadium in SiC by SIMS
SiC中V含量的二次离子质谱分析研究
3.
secondary ion mass spectrometry
次级离子质谱分析法
4.
Study of Quantitative Analysis of Vanadium in SiC by Secondary Ion Mass Spectroscopy;
二次离子质谱分析碳化硅中钒杂质含量的研究
5.
collection angle
收集角 -二次离子质谱术
6.
PRELIMINARY ANALYSES BY SIMS ON TRACE COMPONENTS OF STALAGMITE MICROLAYERS AND THEIR CLIMATE SIGNIFICANCE
石笋微层物质组成的二次离子质谱初步分析及其气候意义
7.
Analysis of Multilayer Film Using RBS/Channeling, Sputtering/RBS and SIMS
多层膜样品的背散射/沟道、溅射剥层/背散射和二次离子质谱分析
8.
useful ion yield
有用离子产额-二次离子质谱术
9.
negative ion yield
负离子产额 -二次离子质谱术
10.
sensitivity factor
灵敏度因子(二次离子质谱术)
11.
incident particle energy
入射粒子能量 -二次离子质谱术
12.
interference signal
干扰信号 -二次离子质谱术
13.
A Study on Quantitative Method for Analysing Some Impurities in Powder Samples with ID-SIMS
粉末样品中某些杂质元素的同位素稀释二次离子质谱定量分析方法的研究
14.
mass analyzed ion kinetic energy spectrometer(MIKES)
质量分析离子动能谱仪
15.
The instrument directs the secondary ions to a mass spectrometer that identifies their compositions.
仪器会将次级离子导向质谱仪，以?定其组成。
16.
Inductively Coupled Argon Plasma Emission Spectrometry Analysis Impurities of Purrified Terephthalic Acid
电感耦合氩等离子发射光谱法分析精对苯二甲酸中的杂质
17.
Ion chromatographic analysis and mass spectrometric identification of complexes of metal and ethylene diaminedisuccinic acid in plants and soils
植物及土壤中乙二胺二琥珀酸金属复合物的离子色谱分析与质谱鉴定
18.
mass analyzed ion kinetic energy spectrometry
质量分析离子动能度谱术