1.
VLBI (very long baseline interferometry)
甚长底线干涉量度法
2.
Technology Research of Gauge Block Length Measurement Based on Interferometry;
基于干涉法的量块长度测量技术研究
3.
Phase-shifting interferometry to the flatness of a compact disk
光盘基片平整度的相移干涉测量方法
4.
Fabry-Perot interferometry
法布里－珀罗干涉测量法
5.
millimetre-wavelength interferometry
毫米波长干涉量度学
6.
multiple exposure interferometry
多次曝光干涉量度学
7.
interferometry by holography
全息照相干涉量度学
8.
Measuring thickness of epitaxial layers of gallium arsenide by infrared interference
GB/T8758-1988砷化镓外延层厚度红外干涉测量方法
9.
Measurement of Refractive Index Using Minimum Visibility of Sodium Light Fringes by Michelson Interferometer
迈氏干涉仪钠光条纹最小可见度法测量折射率
10.
A Multi-Wavelengths Interferometry Applied in Nanometer Scale Measurement;
多波长干涉法在纳米尺度测量中的应用
11.
A Study on Acoustic Impedance Matching Criteria for Coating Thickness Measurement by Ultrasonic Interferometry
超声干涉法涂层厚度测量声阻抗匹配判据研究
12.
Method of Measuring Roundness Error Base on Electronic Speckle Pattern Interferometry
基于电子散斑干涉的圆度误差测量方法研究
13.
Deflection Measurement of Co-alloy Materials by Moiré Interferometry
用云纹干涉法测量和研究双层钴合金的挠度
14.
Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry
基于白光干涉的光学薄膜物理厚度测量方法
15.
Method of measuring roundness error based on ESPI
基于电子散斑干涉技术的圆度误差测量方法
16.
The Common Optical Path Radial Shearing Interferometry to Measure 3-D Temperature Field
共光路径向剪切干涉法测量三维温度场
17.
Measurement of the temperature coefficient of maximal birefringent index of crystal by polarized interference spectrum
测量晶体最大双折射率温度系数的偏光干涉法
18.
Measuring thin-film thickness with phase-shift interferometry
基于相位偏移干涉术的薄膜厚度测量方法