1.
Research on Principle and Method of Calibration on 93k IC Test System
93k集成电路测试系统校准原理及实现方法研究
2.
The Development of BST Integrated Circuits Test System Based on Network
网络化边缘扫描集成电路测试系统研制
3.
Improvement of Back Logic Circuit of IC Test System and Research of Analog Delay Line Capability;
集成电路测试系统后逻辑支持电路改进与模拟延迟线性能分析
4.
An Integrated Circuit Testing System Design based on the Boundary Scan Technology
基于边界扫描技术的集成电路测试系统设计与实现
5.
Research and Design of the MSI Integrated Circuit Automatic Test System
中小规模集成电路自动测试系统的研究与设计
6.
A Transient IC Current Measurement and Analysis System Based on Common ATE
基于普通测试仪的集成电路瞬态电流测量分析系统
7.
linear IC tester
线性集成电路测试仪
8.
integrated circuit functional tester
集成电路功能测试仪
9.
logic integrated circuit tester
逻辑集成电路测试仪
10.
digital integrated circuit measuring-testing instrument
数字集成电路测试仪
11.
Development of New Generation High Temperature Dynamic VLSI Burn-in Test System
新一代大规模集成电路高温动态老化测试系统的研制
12.
New Type Dc Parameters Automatic Test System of VLSI;
新型超大规模集成电路（VLSI）直流参数自动测试系统
13.
The Study and Implementation of the System Software on the IC Tester-GPIB (IEEE 488) Bus;
集成电路性能测试机系统软件的研究与实现—GPIB（IEEE 488）总线
14.
Application Specific Integrated Circuit Test Research in Memory Testing;
存储测试专用集成电路成测技术研究
15.
Development of VLSI High Temperature Dynamic Burn-in and Detecting System Based on Embedded System and Programmable ASICs;
基于嵌入式系统和可编程ASIC的超大规模集成电路高温动态老化测试系统的研制
16.
Designing multi-channel signal acquisition circuit for direct drive motor test system
直驱电机测试系统多路信号采集的调理电路设计
17.
The Development of Computer-testing System for Current Measurement of Current-source in Synthetic Circuit;
合成回路中电流源电流计算机测试系统的研制
18.
The Design of Auto-inspection System of IC Package Quality;
集成电路封装质量自动检测系统的设计