1.
Study of the GIDL Current and Related Reliability Issues for Ultra-deep Submicron CMOS Devices;
超深亚微米CMOS器件GIDL电流及其可靠性研究
2.
The Research of Ni-SALICIDE Process for the Application to Deep Sub-micron CMOS Devices;
适用于深亚微米CMOS器件的Ni自对准硅化物工艺的研究
3.
The High Temperature Application Research of Deep Sub Micron SOI CMOS Circuits;
深亚微米全耗尽SOI CMOS的高温应用分析
4.
Study on SEE characteristic and hardening techniques of CMOS SRAM with sub-micro feature sizes
深亚微米CMOS SRAM SEE特性及加固技术研究
5.
Designing Deep Submicron RF CMOS LCVCO with VPCM
利用VPCM设计深亚微米RF CMOS的LCVCO
6.
The Study on the Hot-Carrier Effect in Deep Sub-Micron MOSFET;
深亚微米MOS器件热载流子效应研究
7.
Research on NBTI in Ultra Deep Sub Micron PMOSFET Device;
超深亚微米PMOSFET器件NBTI研究
8.
Study on the Structure and Reliability of Deep Submicrion SDE MOSFET;
深亚微米SDE MOS器件结构及可靠性研究
9.
A Research on RTS Noise in Ultra Deep Submicron MOS Devices;
超深亚微米MOS器件RTS噪声研究
10.
Research on Hot-carrier Effects for Deep-submicron LDD MOSFET
深亚微米LDD MOSFET器件热载流子效应研究
11.
The Substrate Noise Coupling for Deep-submicron CMOS Mixed-Signal ICs;
深亚微米CMOS混合信号电路衬底耦合噪声模型
12.
Nanoscale CMOS Devices Realization with Micron Technology
微米工艺实现纳米级CMOS器件方法及技术研究
13.
Study on Hot-carrier Effect in Ultra-deep Submicronmeter MOSFET;
超深亚微米MOSFET器件中热载流子效应的研究
14.
FOD Based ESD Protection Devices in Deep Sub-micron Technology
深亚微米工艺中场氧器件静电防护能力的研究
15.
Study on Power Estimation Methodology & Correlative Problem in VDSM Integrated Circuit;
超深亚微米CMOS集成电路功耗估计方法及相关算法研究
16.
Study on the Modeling and Hot Carrier Induced Reliability of Ultra-deep Submicrometer LDD MOSFETs;
超深亚微米LDD MOSFET器件模型及热载流子可靠性研究
17.
The Submicron GaAs PHEMT Device and its Small Signal Modeling;
亚微米GaAs PHEMT器件及其小信号建模
18.
The Machine Vision System of Defect Detection for Deep-submicrometer IC;
深亚微米级IC晶片缺陷检测的机器视觉系统