1.
Mixed Degradation Mode of DEMOS Under Hot-Carrier Stress
DEMOS在热载流子应力下的混合失效模式
2.
An Investigation on Leakage Current Characters and Mechanisms of Metal-induced Laterally Crystallized n-type Polysilicon Thin Film Transistors under Hot Carrier Stress;
金属诱导横向结晶n型多晶硅薄膜晶体管热载流子应力下漏电特性及机制研究
3.
Evaluation of Hot Carrier Effect of SiGe HBT
SiGeHBT的热载流子效应评价
4.
Self-heating Effect and Hot-carrier Effect of Strained-Si CMOS
应变硅CMOS器件的自热效应与热载流子效应
5.
Study of Hot-carrier Degradation Effects of MOSFET;
MOSFET热载流子退化效应的研究
6.
The Study on the Hot-Carrier Effect in Deep Sub-Micron MOSFET;
深亚微米MOS器件热载流子效应研究
7.
Research on MOSFET Noise and Hot Carrier Effect;
MOSFET噪声与热载流子效应研究
8.
Research on Hot-carrier Effects for Deep-submicron LDD MOSFET
深亚微米LDD MOSFET器件热载流子效应研究
9.
A Study of Hot Carrier Effects on Polysilicon Thin Film Transistors by Simulation
多晶硅TFT热载流子效应的模拟研究
10.
The Research of Hot-Carrier Effect and NBTI Effect on Ultra Thin Gate Oxide PMOS Device
超薄栅PMOS器件热载流子效应和NBTI效应的研究
11.
hot carriers in semiconductors
半导体中的热载流子
12.
The Analysis of Thermo-Magneto-Elastic Stress and Deformation in the Thin Current-Carrying Column;
载流圆柱薄壳的热磁弹性应力与变形分析
13.
Study on Hot-carrier Effect in Ultra-deep Submicronmeter MOSFET;
超深亚微米MOSFET器件中热载流子效应的研究
14.
The Influence of Hot Carrier s Retrogradation on IC s Reliability and the Countermeasures;
热载流子退化对集成电路可靠性的影响及应对
15.
Studies of the LDD Process for HCE Improvement
抗热载流子效应的工艺及器件结构研究
16.
Hot-Carrier-Induced Degradation of MOSFETs and a Model to Extrapolate the Lifetime
MOSFET的热载流子效应及其寿命的评估方法
17.
Investigation on pMOSFET During Hot-Carrier Degradation by DCIV Method
基于DCIV法对pMOSFET热载流子损伤的研究
18.
Thermodynamic Analysis and Application of Convective Heat Transfer;
对流换热过程的热力学分析及其应用