1.
FTIR and XPS Spectroscopic Studies of Photodegradation of Moso Bamboo(Phyllostachys Pubescens Mazel)
毛竹材表面光化降解的FTIR和XPS分析
2.
On the Preparation of Thermal Infrared Detecting VO_2 Film and XPS Analysis
热红外探测VO_2薄膜的制备与XPS分析
3.
XPS Analysis of Cellulose Treated with Two Ionic Liquids
两种离子液体处理纤维素的XPS分析
4.
X-Ray Photoelectron Spectroscopy Study of Activation of TiZrV Nonevaporable Getters
TiZrV吸气剂激活过程的XPS分析
5.
Nb Amorphous Metal Oxide Films XPS Analysis and The Mechanism of Photoluminescence
Nb金属氧化物非晶态薄膜的XPS分析及光致发光机理
6.
XPS Analysis of Chromium Element in Chromate Passivation Film Formed on Tinplate in Different Surface State
不同表面状态镀锡钢板铬酸盐钝化膜中铬元素的XPS分析
7.
Analysis of masson pine CTMP with XPS and AFM
马尾松CTMP的XPS和AFM分析
8.
Analysis of Eucalyptus CTMP by XPS and SEM
桉木化学热磨机械浆的XPS和SEM分析
9.
The analysis and application of XPS plate outer thermal insulation for external wall sticking facing brickwork technology
XPS板外墙外保温贴饰面砖技术分析与应用
10.
Infrared Absorption Spectrum (IAS) and X-ray Photoelectron Spectrosco-py (XPS) detect and analyze the adsorption mechanism of diphosphonic acid on the surface of niobite.
同时用IAS和XPS检测和分析了双膦酸对铌铁矿的作用机理。
11.
The Design of Sample Pretreatment Device for Electron Spectrometer and the Application of XPS;
电子能谱仪样品分析前处理装置的研制及XPS的应用
12.
The Effects of Diffusion of Ions on Photocatalytic Activity of TiO_2 Films via XPS Analytical Method
XPS技术分析离子扩散对TiO_2薄膜光催化活性的影响
13.
The Application of AFM and XPS to the Analysis of Fiber Surface of Chemical and Mechanical Pulp
AFM和XPS结合在化学浆和机械浆纤维表面分析中的应用
14.
Active Oxygen Species of Co-V-O Catalysts in Propane Oxidative Dehydrogenation Analyzed by FTIR and XPS Spectra
FTIR和XPS光谱分析Co—V—O催化剂的丙烷氧化脱氢活性氧物种
15.
Influence factors of adhesive property between mortar and XPS board in external thermal insulation composite systems based on XPS
浅析XPS板薄抹灰保温体系中砂浆与XPS板粘结性能的影响因素
16.
XPS and UV-PL Studies on Tin Doped in Float Glass;
浮法玻璃表面渗锡的XPS与UV-PL研究
17.
Set up a Cathode Research Device Connecting with XPS/AES;
建立与XPS/AES相连的阴极研究系统
18.
Study on Defects of SiO_2/4H-SiC(0001) Interface by XPS;
SiO_2/4H-SiC（0001）界面缺陷的XPS研究