1.
Research on Chip Detection and Location Technology Based on Machine Vision
基于机器视觉的表面贴装晶片检测与定位技术研究
2.
The Machine Vision System of Defect Detection for Deep-submicrometer IC;
深亚微米级IC晶片缺陷检测的机器视觉系统
3.
Research and Application of Embedded Wafer Detecting Control System by Machine Vision;
嵌入式IC晶片视觉检测系统技术研究及应用
4.
Study on Automatic Detecting Technique for the IC Wafer by Machine Vision;
IC晶片的机器视觉自动检测技术的研究
5.
A Bimorph Piezoelectric Ceramic Microgripper Integrating Micro-force Detecting and Feedback
集成微力检测与反馈的双晶片微夹持器
6.
Study on the Vision Detection System of Automatic IC Wire Bonder
全自动晶片焊线机视觉检测系统的研究
7.
Premium Wafer - A wafer that can be used for particle counting, measuring pattern resolution in the photolithography process, and metal contamination monitoring.
测试晶圆片-影印过程中用于颗粒计算、测量溶解度和检测金属污染的晶圆片。
8.
Premium Wafer- A wafer that can be used for particle counting, measuring pattern resolution in the photolithography process, and metal contamination monitoring.
测试晶圆片-影印过程中用于颗粒计算、量溶解度和检测金属污染的晶圆片。
9.
Mechanical Test Wafer- A silicon wafer used for testing purposes.
机械测试晶圆片-用于测试的晶圆片。
10.
Research of Clostridium Perfringens Piezoelectric Biosensor Gene-chip Detection System;
压电石英晶体传感器产气荚膜梭菌基因芯片检测系统的研究
11.
A Quartz Crystal Microbalance Gas Detection System Based on Microcontroller
基于单片机的石英晶体微天平气体检测系统设计
12.
photo Darlington detector
光电复合晶体管检测器
13.
Process Test Wafer- A wafer that can be used for processes as well as area cleanliness.
加工测试晶圆片-用于区域清洁过程中的晶圆片。
14.
The RF Wafer Test Technology with SoC Tester
基于SoC测试系统的RF圆晶片测试技术
15.
Calculate mechanically the degrees of intraocular lens as against SRK formula. Examine the visual acuity from the standard table of vision logarithms and set it right by lens.
用SRKII公式自动计算出人工晶状体度数，术后用标准对数视力表检测视力．用镜片矫正。
16.
continuous diaphragm type level detector
膜片式连续液位检测器
17.
diaphragm type pressure balance detector
膜片式压力平衡检测器
18.
microprocessor chip tester
微处理机芯片检测机