1.
Test Suite Generation for TTCN-3 Type System
TTCN-3类型系统测试用例集自动生成
2.
Rapidly Generating Algorithm for Minimum Test Case Set on MC/DC
MC/DC最小测试用例集快速生成算法
3.
Research test case suite minimization based on genetic algorithm
基于遗传算法测试用例集极小化研究
4.
A test suite may contain redundant test cases.
【中英文摘要】一个测试用例集可能含有冗余的测试用例。
5.
Automatic Software Testing Framework Based on the Extraction of Minimized Test Suite
一个基于最小化测试用例集抽取的自动化测试框架
6.
The Research and Implementation of Test Suite Generation for TTCN-3 Compiler
TTCN-3编译器测试用例集自动生成研究与实现
7.
The Research of Test-Suite Reduction Technology Based on Ant Colony Algorithm
基于蚁群算法的测试用例集约简技术研究
8.
Research of real-time test case generation method of trusted software
可信软件实时性测试用例集生成方法研究
9.
Study of Test Suite Minimization Based on Ant Colony Algorithm
基于蚁群算法的测试用例集最小化研究
10.
Optimal test suite generation methods based on fusion of environment and state parameters
环境参数与状态参数融合的测试用例集约简方法
11.
Research and Application on Generating Integration Test Cases based on UML;
基于UML的集成测试用例生成方法的研究与应用
12.
Research of Test Suite Optimization Method on Regressing Test Model
基于回归测试模型的用例集的优化研究
13.
Method of COTS Component Integration Test Case Generation Based on the Run-time Interaction Constraints
一种基于运行时交互约束的COTS构件集成测试用例生成方法
14.
An Approach to Generating Integration Test Case Based on Object-Z Specification
一种基于Object-Z规格说明的集成测试用例生成方法
15.
Ability to write test plans, test cases and track results.
会写测试计划、测试用例，并跟踪测试结果。
16.
Metamorphic Testing and Special Case Testing: A Case Study
关于蜕变测试和特殊用例测试的实例研究(英文)
17.
Application Specific Integrated Circuit Test Research in Memory Testing;
存储测试专用集成电路成测技术研究
18.
An in-circuit tester tests a digital IC using the IC's truth table.
在线测试设备采用真值表来测试数字集成电路。