1.
Scheduling Study for Semiconductor Final Test Based on Reinforcement Learning
基于增强学习的半导体测试调度研究
2.
semiconductor memory test system
半导体存储器测试系统
3.
galloping 1 and 0
跃步“１”和“０”-半导体存储器的测试法
4.
galloping write and recovery
跃步写和恢复-半导体存储器的测试法
5.
Test methods for semiconductor device curve tracers
GB/T13974-1992半导体管特性图示仪测试方法
6.
Laser Diode Burn-in and Reliability Testing;
半导体激光器筛选方法及可行性测试
7.
Application Research of PCM Test Technology on Semiconductor Chip Manufacture
半导体芯片PCM测试技术的应用研究
8.
Research of Semiconductor Chip Test Data Transmission Method
半导体芯片测试数据传输方法的研究
9.
Standard methods for measuring conductivity type of extrinsic semiconducting materials
GB/T1550-1997非本征半导体材料导电类型测试方法
10.
Sound knowledge in semiconductor physics, semiconductor device testing and characterization.
具备半导体物理学,半导体设备测试和性能的相关知识.
11.
Test procedures for semiconductor charged particle detectors
GB/T5201-1994带电粒子半导体探测器测试方法
12.
The Mean Value Survey Law for Thermal Resistance Test of Power Semiconductor Radiator
电力半导体散热器热阻测试中的平均值测量法
13.
Measuring methods for gas sensors of metal-oxide semiconductor
GB/T15653-1995金属氧化物半导体气敏元件测试方法
14.
Test procedures for semiconductor X-ray energy spectrometers
GB/T11685-1989半导体x射线能谱仪的测试方法
15.
Study on High-power Laser Diode s Divergence Angle Testing System;
高能半导体激光器发散角测试系统研究
16.
Research on the Characteristics Measurement of Light Emitting Diodes and Laser Diodes;
发光二极管及半导体激光器特性参数测试研究
17.
The Research and Development of Full Automatic Semiconductor Arresrer Testing and Sorting System;
全自动半导体放电管分选测试系统研究与开发
18.
The Research and Development of Semiconductor Testing System Based on S3C44B0;
基于S3C44B0的半导体分立器件测试系统的开发