1.
The Research and Development of Semiconductor Testing System Based on S3C44B0;
基于S3C44B0的半导体分立器件测试系统的开发
2.
The Development of Discrete Semiconductor Testing System with CPLD Simulated System Bus;
基于CPLD模拟系统总线的半导体分立器件测试系统开发
3.
The Research and Development of Semiconductor Testing Equipment Based on Embedded Technology;
基于嵌入式技术的半导体分立器件测试系统的开发
4.
Optical Passive components Measurements System Designed and testing Error Analysis
光无源器件测试系统设计和测试误差分析
5.
Analysis and Test of Software Timer in μC/OS-Ⅱ
μC/OS-Ⅱ软件定时器的分析与测试
6.
Study on Traveling-wave Electrode and Test Analysis of Electro-optic Modulator;
电光调制器行波电极系统及器件测试分析
7.
Analyzing to Set up PLC Software Platform of Function Testing for the Door-lock Latch in Automobiles
建立汽车门锁锁体功能测试PLC软件平台分析
8.
System software includes software of microprocessor and test of DTE.
系统软件分为微处理器软件和终端测试软件两部分。
9.
Disconnect test leads from relay cavities immediately after testing.
测试后立即从继电器上拆卸测试导线。
10.
electronic component parameter measuring instrument
电子元件参数测试仪器
11.
TACT (Transistor and Component Tester)
晶体管和元件测试器
12.
The Analysis of DRAM New Fabrication Process and Electric Test Parameter;
DRAM器件制造的新工艺和电性测试参数的分析
13.
The Hardware Design of Batch Testing and Separating System for Pt-Resistance Temperature Sensor;
Pt膜温度传感器批量测试分选系统硬件设计
14.
Measuring High Gain CATV Node with High-Speed Optical Component Analyzer
用高速光器件分析仪测试高增益CATV光站
15.
Impart Knowledge of Software Testing to Student Based on Software Testing Classification
围绕软件测试分类传授软件测试知识
16.
Research on Off-Line Debugging of VLSI Device Test Programs;
VLSI器件测试程序脱机调试的研究
17.
Test Condition Investigation in ESD Charge Device Model;
ESD荷电器件放电模式的测试条件研究
18.
In functional testing, particular features are tested in isolation.
在功能测试中，某个功能部件是孤立测试的。