1.
Study on the Application of the Environmental Factor in the Reliability Evaluation of Electronic Products
环境因子在电子产品可靠性评定中的应用研究
2.
Test Method Research on Reliability Enhancement Testing for Module-Level Electronic Products;
模块级电子产品可靠性强化试验方法研究
3.
Research on step-up-stress Accelerated Degradation Testing Method and Application in Reliability Assessment
步进加速退化试验及其在电子产品可靠性评估中的应用
4.
Discussion of the Reliability Design of Electronic Products for Railway Passenger Cars
浅谈轨道客车电子产品的可靠性设计
5.
The Study and Discuss of the Electronic and Electrical Products (Equipments) Reliability Administration;
电子电气产品(设备)可靠性管理的研究与探讨
6.
Accelerated Storage Reliability Model and Statistical Analysis of Electronic Products;
电子产品的加速贮存可靠性模型及统计分析
7.
Discussion on Product EMC Design and Production Reliability
产品电磁兼容设计和生产可靠性探讨
8.
" Guide for the collection of reliability,availability and maintainability data from field performance of electronic items"
GB/T5081-1985电子产品现场工作可靠性、有效性和维修性数据收集指南
9.
The electric aplonances all asopts to import the famous brand product, functions dependable.
电器均采用进口名牌产品、性能可靠。
10.
The Dynamic Study of the Relationship Between Life Cycle Cost and Reliability in Electronic Product
电子产品寿命周期费用与可靠性关系的动态研究
11.
Study on Drop Reliability for TFBGA of Lead Free Portable Electronic Products Board Level Assembly;
无铅便携式电子产品板级组件的TFBGA跌落可靠性研究
12.
PREP (Product Reliability Evaluation Program)
产品可靠性鉴定计划
13.
Automation on cutting, capping, sorting and coating, it comes out in good quality, reliability and economic price.
自动化大量生产，品质安定，信赖可靠，价格便宜，为电子产品广泛使用。
14.
The Reliability Evaluation Methods of the Products of Electrical Engineering and the Applications of the Bayes Theory;
电工产品可靠性评估方法与贝叶斯理论的应用
15.
Bayes Analysis of the Electrical Product under the State of the Zero-failure
无失效数据情形下电器产品的Bayes可靠性分析
16.
Random Vibration Accelerated Test and Reliability Evaluation of Small Samples Components;
小子样产品的随机振动加速试验及可靠性评估
17.
Research of equivalent programme about small number sample reliability qualification test
小子样产品可靠性鉴定试验等效方案研究
18.
Tin whiskers, growing spontaneously from Sn and Sn alloy coatings, can cause electrical shorts in the circuit and present a long-term reliability problem to the electronic industry.
锡须，一种自发从锡和锡合金层生长出来的现象，它会导致电路短路,影响电子产品长期的可靠性。