1.
A high-resolution and high-precision instrument, dyamic capacitance measuring instrument of thin-film thick-ness, is introduced in this paper.
本文介绍一种高精度高分辨率的仪器－电容式动态薄膜测厚仪。
2.
Determination of thickness of plastic film and sheeting by mechanical scanning
GB/T6672-1986塑料薄膜和薄片厚度的测定机械测量法
3.
testing method for thickness of plastic film and sheeting
塑料薄膜和片材的厚度测定法
4.
Design and Software of X-ray Thickness Gauge for Plastic Film;
薄膜X射线测厚仪的设计和软件开发
5.
Research Development of Measurement Methods for Piezoelectric Coefficient of Thin/Thick Film
薄/厚膜压电参数测量方法的研究进展
6.
Design of ARM920T-based Online Measuring System for Thickness of Thin Films
基于ARM920T的薄膜厚度在线测量系统设计
7.
Investigation into Measuring Nanometer Lubrication Film Thickness by Relative Light Intensity Principle
相对光强原理测量纳米级润滑薄膜厚度的研究
8.
Study on Determination of Optical Constants and Thickness of Thin Films by Transmission Spectrum Method;
薄膜光学常数和厚度的透射光谱法测定研究
9.
Research on Scanning System for Measuring the Thickness of Plastic Film Based on Capacitive Sensor;
电容式塑料薄膜厚度扫描检测系统的研究
10.
Research of Online Noncontact Film-Thickness Measuring System Based on DSP;
基于DSP的非接触薄膜厚度在线测量系统研究
11.
Refractive Index and Thickness of Michelson Interferometer Measure Film;
迈克尔逊干涉仪测量薄膜的折射率与厚度
12.
Thickness Measurement of In_xGa_(1-x)N Semiconductor Film Based on Reflection Spectra
基于反射光谱的In_xGa_(1-x)N半导体薄膜厚度测量
13.
Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry
基于白光干涉的光学薄膜物理厚度测量方法
14.
Measuring thin-film thickness with phase-shift interferometry
基于相位偏移干涉术的薄膜厚度测量方法
15.
Determination of the optical constants and thicknesses of MEH-PPV and PFO thin films
MEH-PPV和PFO发光薄膜的光学常数和厚度测定
16.
Effects of film thickness on the properties of ferroelectric film
薄膜厚度对铁电薄膜铁电性能的影响
17.
The Measurement Based on CCD Method about Thickness of Liquid Films and the Analysis of Break-down Characteristic of Thin Films;
基于CCD方法的液膜厚度测量及薄膜破断特性的分析
18.
Film Thickness of the Alpha Energy Loss Measurement and Detection Efficiency γ Spectrum of MCNP Simulation Method Described;
薄膜厚度的α能损法测量和γ谱探测效率的MCNP模拟描述方法研究