1.
Study on Thickness Distribution Uniformity Control of Soft X-ray Multilayer Mirrors;
![点击朗读](/dictall/images/read.gif)
软X射线多层膜膜厚分布均匀性控制研究
2.
The Research of Multilayer Polarizing Components in Extreme Ultraviolet and Soft X-Ray;
![点击朗读](/dictall/images/read.gif)
极紫外与软X射线多层膜偏振元件研究
3.
The Study of Extreme Ultraviolet and Soft X-ray Narrowband Multilayers;
![点击朗读](/dictall/images/read.gif)
极紫外和软X射线窄带多层膜的研究
4.
Structure and thermal stability of Mo/Al multiayers for soft X-ray mirrors;
![点击朗读](/dictall/images/read.gif)
Mo/Al软X射线光学多层膜的结构及其热稳定性
5.
Study on Optimum Design and Fabrication of X-ray Broadband Multilayer;
![点击朗读](/dictall/images/read.gif)
X射线宽带多层膜的设计方法及制备工艺研究
6.
Structure of solid-supported short chain DNA/lipid multilayers
![点击朗读](/dictall/images/read.gif)
同步辐射X射线衍射研究短链DNA/磷脂多层膜的结构
7.
Diffraction Efficiency of Multilayer-Based Laue Lens for Hard X-ray Focusing
![点击朗读](/dictall/images/read.gif)
基于多层膜技术的硬X射线Laue透镜衍射效率的理论研究
8.
Design and Software of X-ray Thickness Gauge for Plastic Film;
![点击朗读](/dictall/images/read.gif)
薄膜X射线测厚仪的设计和软件开发
9.
Calibration and application of multi-channel soft X-ray Dante spectrometer
![点击朗读](/dictall/images/read.gif)
多通道软X射线Dante谱仪标定及实验
10.
multilayered plating thickness X-ray spectrofluorometer
![点击朗读](/dictall/images/read.gif)
多层镀厚度x射线荧光谱仪
11.
EDS Analysis of Blackishgreen Colored Passivation Film on Zinc Coating
![点击朗读](/dictall/images/read.gif)
镀锌层墨绿色钝化膜的X-射线能谱分析
12.
Applications of Polycrystal X-ray Diffraction
![点击朗读](/dictall/images/read.gif)
多晶 X射线衍射应用
13.
ultrasonic tomograph
![点击朗读](/dictall/images/read.gif)
超声层析X射线摄影机
14.
conventional X-ray tomography
![点击朗读](/dictall/images/read.gif)
常规X射线层析成象
15.
X-ray tomograph
![点击朗读](/dictall/images/read.gif)
x射线断层摄影装置
16.
X-ray tin coating thickness gauge
![点击朗读](/dictall/images/read.gif)
x射线锡涂层测厚仪
17.
The phase compositions and morpholog ies of the film were analyzed by XRD and SEM.
![点击朗读](/dictall/images/read.gif)
通过X射线衍射及扫描电镜分析了膜层的相组成及形貌特征。
18.
Effect of Different Buffer Planes in AlGaN Epitaxial Thin Film on Structure and Properties Studied by XRD
利用X射线衍射考察不同缓冲层对AlGaN外延薄膜微结构的影响