1.
semiconductor memory test system
半导体存储器测试系统
2.
computer-controlled memory test system
计算机控制存储器测试系统
3.
Research and Realization of the Test Algorithm for Embedded Memory
嵌入式存储器测试算法的研究与实现
4.
Research on Memery Test Technologies and It s Application in Quality Testing;
存储器测试技术及其在质量检验中的应用研究
5.
SDRAM Tester Design Based on FPGA
基于FPGA的同步动态随机存储器测试仪的实现
6.
galloping 1 and 0
跃步“１”和“０”-半导体存储器的测试法
7.
galloping write and recovery
跃步写和恢复-半导体存储器的测试法
8.
High Speed Memory Test System Based TIGERSHARC DSP;
基于TIGERSHARC DSP的存储器的高速测试系统
9.
The Storage Test System Designing Based on Programmable Device
基于可编程器件的存储测试系统设计
10.
A Study on Memory Built-in Self-Test and Functional Core Testing;
存储器内建自测试及内核功能测试研究
11.
Application of Ferroelectric RAM in the System for Testing Releaser Lifetime
铁电存储器在脱扣器寿命测试台系统中的应用
12.
Research on Design for Testability and Test Algorithm of Embedded Memory
嵌入式存储器的可测性设计及测试算法研究
13.
Research of Electric Parameters Measurement System and Storing Performance Demo System for Phase Change Memory;
相变存储器电学性能测试与存储性能演示系统研究
14.
Design Optimization of Static Random Acess Memory Bitcell and Testchip;
静态随机存储器位单元与测试结构设计优化
15.
High Speed and High Parallel Test Solution of High Density Memory Devices;
大规模存储器的高速并行测试解决方案
16.
Static Memory Test Methodology for 90nm Technology;
基于90纳米工艺静态存储器的测试方法学
17.
Improvement of March Algorithm Based on Memory Fault Primitive
一种基于存储器故障原语的March测试算法研究
18.
DSP peripheral memory march test research based on navigation receiver
基于导航接收机的DSP外设存储器行进测试技术