1.
The RF Wafer Test Technology with SoC Tester
基于SoC测试系统的RF圆晶片测试技术
2.
The Research on Test Data Compression of System-on-a-Chip (SoC);
系统芯片SoC测试数据压缩方法研究
3.
The Research of SoC Test on Variable Length Coding
变长编码在SoC测试中的应用研究
4.
High-speed SoC test with switching TAM
可切换式TAM结构的快速SoC测试方法
5.
Construction of Transparent Paths for IP Cores in SoC Test
SoC测试中IP核透明路径的构建
6.
Test Wrapper and Test Access Mechanism Co-optimization for SoC Based on Ant Colony Algorithm
SoC测试访问机制和测试壳的蚁群联合优化
7.
The Research of SoC Test Data Compression Based on Data Block Coding;
基于分块编码的SoC测试数据压缩方法研究
8.
The Test Data Compression of System-on-a-Chip (SoC) Based on Dimidiate Partition and Packet-sharing;
基于折半划分和分组共享的SoC测试压缩方法
9.
Research on Test Data Compression of SoC Based on LFSR Reseeding;
基于LFSR重新播种的SoC测试数据压缩方法研究
10.
Research on Test Data Partition Compression of System-on-Chip;
片上系统SoC测试数据分组压缩方法的研究
11.
Testing Time and Testing Power For a SOC Co-optimization
SOC测试时间与测试功耗协同优化
12.
Design-for-Testability and Test of Garfield Series SoC’s
Garfield系列SoC芯片可测性设计与测试
13.
The Fundamental Research on Micro Gas Pressure Testing Instrument Based on SOC Technology;
适用于SOC式微气压测试仪的基础研究
14.
The Research of SOC Test Method Based on RAS Architecture;
基于RAS结构的SOC测试方法的应用研究
15.
The Research on the Coding Method of SOC Test Pattern Compression;
针对SOC测试数据压缩的编码方法研究
16.
Research on the On-Chip Bus and Testing Technology in the SoC Platform;
SoC设计平台片上总线及测试技术研究
17.
SoC Textile Fabrics Gray Coefficient Tester Design;
基于SoC纺织物灰度系数测试仪的设计
18.
Core-test Technology and Application in SOC Design
SOC中可复用IP核的测试技术与应用