1.
Research on Improving the Precision of Ellipsometry-Measured Optical Parameters of Thin Films;
提高椭偏测量中薄膜参数精度的研究
2.
Influence of parasitic ghost reflection on measurement in a heterodyne interferometric ellipsometer
寄生虚反射对外差干涉椭偏测量的影响
3.
Influence of Metal-Coated Mirrors on Measurement Accuracy in Heterodyne Interferometric Ellipsometry
金属反射镜对外差干涉椭偏测量精度的影响
4.
To this end, we have performed in situ ellipsometry measurements while etching through homogeneous, comparatively thick SiGe films of a known Ge content.
为此，我们实施了对于刻蚀均匀的比较厚的已知锗浓度的锗硅薄膜的同步椭偏测量。
5.
Sensitivity analysis of ellipsometric parameters in ellipsometric spectral measurement
椭偏光谱测量中椭偏参数的灵敏度分析
6.
Theoretical and Experimental Study on the Heterodyne Interferometric Ellipsometry;
外差干涉椭圆偏振测量的理论与实验研究
7.
Theoretical Study and Analysis of Ellipsometer Method to Determine the Optical Film Parameters
椭偏法测量光学薄膜参数的理论研究与分析
8.
Study on Ellipsometry in Confirming Polarization Parameters of Phase Slice
确定相薄片偏振参量的椭偏仪法研究
9.
Estimation of deviation between circular target center and ellipse imaging center in close-range photogrammetry
近景摄影测量圆形标志与其椭圆构像的中心偏差估计
10.
When the end of the electric field vector travels in an ellipse, the light is elliptically polarized.
电场矢量的末端沿一椭圆移动的光叫椭圆偏振光。
11.
The Rotary Kiln Shell Ovality Measurement System Based on LabVIEW
基于LabVIEW回转窑筒体椭圆度测量系统
12.
Setout ellipse curve with the traditional method of four-center will bring up offset of point and deformation of chart.
四心圆法测设椭圆曲线会造成点位偏移,图形变形。
13.
The Determination of Thickness and Refractive Index of Magnetic Garnet Films by Multiple Angle Laser Ellipsometry
激光椭偏仪多角入射法测定磁性石榴石薄膜的厚度和折射率
14.
Calculation of Capacitances of Elliptic Cylinder Capacitor and Eccentic Cable by Dual Energy Method
用双能量法计算椭圆柱形电容器和偏心电缆的电容
15.
Incremental Unknowns Methods on Floated Grid for Solving Linear Elliptic PDEs
漂移网格上增量未知元方法求解椭圆型偏微分方程
16.
Doppler drift angle measuring apparatus
多普勒偏航角测量器
17.
Extent of yawing, measured in degrees.
偏航角偏航限度，用于测量程度
18.
elliptical cladding single-polarization fiber
椭圆包层单偏振光纤