1.
collection angle
收集角 -二次离子质谱术
2.
secondary ion mass spectroanalyzer
二次离子质谱分析器
3.
useful ion yield
有用离子产额-二次离子质谱术
4.
negative ion yield
负离子产额 -二次离子质谱术
5.
sensitivity factor
灵敏度因子(二次离子质谱术)
6.
incident particle energy
入射粒子能量 -二次离子质谱术
7.
interference signal
干扰信号 -二次离子质谱术
8.
Studies of Vanadium in SiC by SIMS
SiC中V含量的二次离子质谱分析研究
9.
Study of Quantitative Analysis of Vanadium in SiC by Secondary Ion Mass Spectroscopy;
二次离子质谱分析碳化硅中钒杂质含量的研究
10.
PRELIMINARY ANALYSES BY SIMS ON TRACE COMPONENTS OF STALAGMITE MICROLAYERS AND THEIR CLIMATE SIGNIFICANCE
石笋微层物质组成的二次离子质谱初步分析及其气候意义
11.
Analysis of Multilayer Film Using RBS/Channeling, Sputtering/RBS and SIMS
多层膜样品的背散射/沟道、溅射剥层/背散射和二次离子质谱分析
12.
The Principle and Application in Semiconductor of SIMS
二次离子质谱仪的原理及在半导体产业中的应用
13.
A Study on Quantitative Method for Analysing Some Impurities in Powder Samples with ID-SIMS
粉末样品中某些杂质元素的同位素稀释二次离子质谱定量分析方法的研究
14.
secondary ion mass spectrometry
次级离子质谱分析法
15.
UF6 mass spectrometers/ion sources
UF6质谱仪/离子源
16.
Determination of Trace Ammonium in Secondary Refined Brine by Ion Chromatography
离子色谱法检测二次精盐水中的痕量铵
17.
plasma chromatograph-mass spectrometer (PC-MS)
等离子色谱-质谱联用仪
18.
The instrument directs the secondary ions to a mass spectrometer that identifies their compositions.
仪器会将次级离子导向质谱仪，以?定其组成。