1.
Test method for measuring resistivity of silicon wafers using spreading resistance probe
GB/T6617-1995硅片电阻率测定扩展电阻探针法
2.
Researching and Developing of Intelligent Four-Probe Resistivity Meter s;
智能四探针电阻率测试仪研究及开发
3.
Test method for resistivity of silicon and germanium bars using a two-point probe
GB/T1551-1995硅、锗单晶电阻率测定直流两探针法
4.
Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
GB/T1552-1995硅、锗单晶电阻率测定直排四探针法
5.
The forms of thermistors are beads, probes, disks, and rods.
热敏电阻的形状有珠状、探针状、圆片状和柱状。
6.
This paper briefly introduces the method which adopts RTD(PT100)for lower temperature measuring.
针对铂电阻用于深低温测量进行了探讨。
7.
Application of Two-Probe Spreading Resistance Technique in the Manufacturing Process of IC
二探针扩展电阻分布法在IC芯片制造中的应用
8.
The equation of four probes method for resistivity measurement requires point contacts and a definite configuration of probes array.
测量电阻率的四探针法公式中,要求是点接触而且探针的排列有一定的形状。
9.
Study on the Four Point Probe Technique for the Sheet Resistance Measurement of the Micro-Area Integrating with Image Analysis;
结合图像分析的微区薄层电阻四探针测试技术研究
10.
Studies of the Degradation of Organic Coatings Using EIS and SKP;
联合应用电化学阻抗谱和扫Kelvin探针研究有机涂层劣化
11.
Study on Silicon Sheet s Micro-Area s Resistance Stability Measured by Four Point Probe Method;
用四探针法测试硅片微区薄层电阻的稳定性研究
12.
Alternative Measurement Method for Intrinsic Indication Error of Four-probe Resistivity Tester
四探针电阻率测试仪示值基本误差的变通计量方法
13.
The Effect of Stellate Ganglion Block or Stellate Ganglion Block Plus Electroacupuncture on Paralysis of Lower Lip Induced by Extraction of Third Lower Molar
下唇麻痹的星状神经节阻滞和电针灸疗法临床疗效探讨
14.
capacitance-divider probe
电容分压探针,电容分配探针
15.
electron operation desk of EPMA
电子探针的电子操纵台
16.
" Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array"
GB/T14141-1993硅处延层、扩散层和离子注入层薄层电阻的测定直排四探针法
17.
THE WHEEL SPEED SENSOR PINS AND GROUN
某一轮速感知器插针和地之间的电阻。
18.
electron probe X-ray analyzer
电子探针x射线分析器