1.
Interference Filter of Reflectance in 650nm and Transmittance in 10.6μm;
650nm反射10.6μm透射的薄膜干涉滤光片
2.
Effects of the Light Nonmonochromatic on Thin Film Interference Fringes;
光的非单色性对薄膜干涉条纹的影响
3.
The colour rings and spots on the glaze surface are caused by optical interference in the film.
釉面闪现色斑和色环是由于光的薄膜干涉。
4.
Study on Linear Tuning Filters Based on Interference Thin Film Filters;
基于薄膜干涉滤光片的线性调谐光滤波器研究
5.
The condition produced the additional phase difference pi in the film interfere problem;
关于薄膜干涉问题中产生附加位相差π的条件
6.
Introduction of Filter Effect of Thin Film Interference in College Physics Teaching;
在大学物理教学中介绍薄膜干涉的滤波效应
7.
Light Interference of Thin Films and the Related Optical Principle;
一种演示薄膜干涉的方法及其相关光学原理
8.
Application of toy laser to film interference and Brownian motion experiments
玩具激光器在薄膜干涉和布朗运动实验中的巧用
9.
thin-film single junction quantum interferometer
薄膜单结量子干涉仪
10.
Along the length of the filter, the interference film looks like a wedge.
沿薄膜的长度方向看干涉膜似尖劈。
11.
Along the length of the filter, the interference film like a wedge.
沿薄膜的长度方向看干涉膜尖劈。
12.
Refractive Index and Thickness of Michelson Interferometer Measure Film;
迈克尔逊干涉仪测量薄膜的折射率与厚度
13.
Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry
基于白光干涉的光学薄膜物理厚度测量方法
14.
Measuring thin-film thickness with phase-shift interferometry
基于相位偏移干涉术的薄膜厚度测量方法
15.
Polarizing beam splitter prism (PBS) is based on the interference inside thin film and the law of Brewster.
薄膜偏光分束镜是基于薄膜内光的干涉作用和布氏角的特点研制而成。
16.
THE THICKNESS AND REFACTURE INDEX OF SINGLELAYER FILM MEASURED BY MICHELSON INTERFEROMETER
用迈克尔逊干涉仪测量单层薄膜的厚度和折射率
17.
Study on the measurement of using new Fabry-Perot Thin cavity interferometer
一种新型薄腔法-珀干涉测速系统研究
18.
Synthesis and Characterization of Poly-vanadium-titanium Acid Xerogel Thin Films
复合钒钛酸干凝胶薄膜的制备及表征