Raman-atomic force microscopy(Raman-AFM) is a new morphology characterization and optoelectronic measurement instrument based on the Tip-enhanced Raman Scattering Effect(TERS).

Researching crystal defects with atomic force microscope;

The diamond surface microstructures investigated by atomic force microscope;

Study of DNA damage induced by potassium dichromate and glutathione with atomic force microscope;

Study on the two of algae-lysing bacteria which control red-tide of Phaeocystis globosa by AFM;

Study on salinity on growth of Phaeocystis globosa by AFM;

Experiment observation of coal surface structure in mesoscopic scale by atomic force microscope(AFM);

The application of atomic force microscopy(AFM) in starch granule structure research;

Its aggregation property in 50(mg·L~(-1))CaCl_2 solution was investigated by the atomic force microscopy(AFM).

The microstructure and morphology of the lead telluride optical thin films prepared by ion beam assisted deposition(IBAD) were observed by atomic force microscopy(AFM).

Applications of atomic force microscopy to characterization of synthetic membranes;

Mechanism and Progress About Protein Crystal Growth by Atomic Force Microscopy;

Application of atomic force microscopy in biomedical studies;