1) channel defects
通道缺陷
2) channel defect
通道型缺陷
1.
The channel defects with diameters between 50 μm and 150 μm in the seal area of flexible packages are detected using backscattered echo envelope integral imaging method.
将超声无损检测技术应用于软包装热封性能检测中,采用背散射回波包络积分成像技术,对塑料软包装封口处直径为50～150μm的6种通道型缺陷进行实验研究。
3) Higher order path remote defect indication(HP-RDI)
高阶通道远端缺陷指示
4) Lower order path remote defect indication(LP-RDI)
低阶通道远端缺陷指示
6) defect pipelines
缺陷管道
1.
In view of different defect types,the methods and developments in domestic and foreign of the remaining strength assessment about defect pipelines were introduced,technical thoughts of remaining strength was introduced.
针对不同的缺陷类型,介绍了国内外含各种缺陷管道的剩余强度评价方法及其进展,阐述了剩余强度评价的技术思路。
补充资料：点缺陷(见晶体缺陷)
点缺陷(见晶体缺陷)
point defect
点缺陷point defeet见晶体缺陷。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条