1) Universal Diversity Technology
通用分集
2) universal cut
通用割集
1.
Combinational equivalence checking method based on universal cut and special cut;
结合通用割集和专用割集的组合电路验证方法
4) general Dyson sets
通用Dyson集
5) universal set
通用集合
6) universal test set
通用测试集
1.
In order to improve the testability of digital circuits,an easily testable network of arbitrary polarity OR-Coincidence type for arbitrary logic functions was proposed and the universal test sets which could detect all single stuck-at faults in the network were given.
为提高数字电路的可测性,提出了一种可实现任意逻辑函数的任意极性或-符合型易测性网络,并给出了测试网络中所有单固定故障的通用测试集。
2.
For improving testability of digital circuits, easily testable realizations of positive polarity OR-Coincidence network(PPOC network) for arbitrary logic functions were proposed and universal test sets which detect all single stuck-at faults in the network were given.
为提高数字电路的可测性,提出了可实现任意逻辑函数的正极性或-符合网络的易测性实现,并给出了测试网络中所有单固定故障的通用测试集。
补充资料:通用
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