1) BATS Bit Access Test System
比特存取测试系统
2) storage measurement system
存储测试系统
1.
The design on high speed data acquisition and storage measurement system based on USB bus;
基于USB总线的高速数据采集存储测试系统的设计
2.
Aiming at the problem on the acceleration storage measurement system of exterior trajectory accurately transmitting information measured and the effect of environment interfered on the system,several important parameters such as the time-entropy of the information measured,the channel capacity of storage measurement system,anti-interfering tolerance of the system,were calculated.
针对外弹道加速度存储测试系统正确传输被测信息以及外界干扰对系统影响的问题,研究并计算了被测信息的时间熵、存储测试系统信道容量、系统抗干扰容限等参数及其相关关系。
3) memorizing and testing system
存储测试系统
1.
In allusion to parameter test of medium and big caliber shell,acceleration memorizing and testing system of outer trajectory is designed and realized by applying C8051F020 MCU.
文中主要介绍了存储测试系统的构建,提出了二级存储技术,并能够在系统掉电情况下保持数据的完整性和系统二次上电时的可回读性。
4) memory system testing
存储系统测试
5) analog test system
类比测试系统
补充资料：随机存取存储器(见半导体存储器)
随机存取存储器(见半导体存储器)
random access memory,RAM
s日1}}Cunq日Ct旧choql随机存取存储器random aeeess memoryRAM)见半导体存储器。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条