1) secondary defect
二次缺陷
1.
The causes of stress and secondary defects were pointed out,the methods to reduce stress and reduce the secondary defects were given,the effects of stress and secondary defects on bipolar transistor parameters performance were analyzed,the approaches how to distinguish these effects produced by stress or secondary defects were proposed.
半导体器件和集成电路中存在着两大类应力,提出了应力及其引起的二次缺陷产生的原因、以及如何减小产生的应力和减少二次缺陷的措施,分析了应力和二次缺陷对双极型晶体管的参数性能的不同影响,以及如何区分产生的这些影响是由何种应力或二次缺陷引起的办法。
2) defect level
缺陷层次
3) Minor Deficiency
次要缺陷
4) sub surface defects
次表面缺陷
1.
Pulsed video thermography technology offers a means of performing fast,large area,instant and audio visual inspection on material sub surface defects.
PVT技术对于材料的次表面缺陷能够实现大面积、快速、实时直观的无损检测 采用一些近似条件 ,对热脉冲作用被检测材料表面后 ,考虑了材料次表面平面缺陷对表面温度的影响 ,得出了表面温度与缺陷的大小、深度以及作用时间的相互关系 ,从而为PVT技术的定量检测提供理论依
5) MIN Defect
轻(次要)缺陷
6) second collapse
二次塌陷
1.
The elas-plasticity and creep of the second collapse were computed,and the final range of the pit was forecasted.
采用自行开发的ROCK MODEL程序建立了研究区三维地质模型,然后根据现场实际情况进行反演分析,确定矿体开采范围和岩土体物理力学参数;其次对塌陷坑现状进行流变分析;最后对二次塌陷进行弹塑性和流变计算,预测塌陷坑最终的发育范围,并提出相应防治措施。
补充资料：二次缺陷(见半导体中的杂质缺陷)
二次缺陷(见半导体中的杂质缺陷)
process-induced defects
二次缺陷proeess一induced defeets见半导体中的杂质缺陷。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条