Study on the effect of oblique sputtering on TbFe thin films by MFM;

Through the sample surface analysis by Atomic Force Microscope (AFM) and Magnetic Force Microscope (MFM), it is showed that the condition of annealing will effect the distribution of the grain in sample.

In this paper, the using of Magnetic Force Microscopic (MFM) was introduced andthe transformations of magnetic domains were investigated by MFM.

It is analysed using magnetic force microscopy in this paper,and the result of magnetic force image ( MFI) shows that the sample induces a hard magnetic R_2M_(14)B(M=Fe or Co,R=Nd or Dy) phase after annealing.

The magnetic tips dependence of the magnetic domains in low coercivity magnetic (YGdBi)3(GaFe)_5O_12 garnet was investigated using magnetic force microscopy.

The magnetic tips dependence of the magnetic domains in low coercivity magnetic(YGdBi)_3(GaFe)_5O_(12) garnet was investigated using magnetic force microscopy.

Preparation of nickel tips used in magnetic force microscope;

Progress in magnetic functional materials and applications in 1997~1998 is described, viz: (1) amorphous and nano crystalline soft magnetic materials; (2) new magnetic effects and new magnetic functional materials; (3) magnetic resonance imaging of electrical activity in the living body; (4) new application of magnetic force microscope; (5) progress in the study of magnetic levitation trains.