Comparison of amplitude vector method and half-wave spectrum method to analyze grating diffraction;

Analyses of grating diffraction by computer simulation;

Testifying secondary maximum among slits interference item of grating diffraction is symmetrical with Fresnel Zone Plate Method;

Study of the photoelectric ruling control on the fabricating of the high density diffraction grating;

Super-fine Diamond Tools for Ruling Diffraction Gratings;

The second kind angular dispersion and the analysis of characteristics of diffraction grating;

Simulation research for particle shape measurement with laser diffraction;

CCD Measuring System for Wire Diameter by Laser Diffraction;

Improvement of the method of laser diffraction measuring light-guiding fiber diameter;

XRD,SEM and hysteresis loop were measured to investigate and study the relationship between structure,microstructure and ferroelectric properties of Barium Titanate ceramics.

XRD, SEM, temperature and frequency dependence of dielectric constant, and hysteresis loop were measured to investigate and study structure, microstructure, dielectric and ferroelectric properties of Barium Titanate dielectric ceramics.

At the same time, the quality of the ZnO thin film is characterized by XRD and photo luminescence spectrum before and after annealed.

A coaxial measuring system for a hole using non-diffracting beam;

Generation of short pulse and high power non-diffracting beam by active and passive schemes based on axicon;

Study on property of central spot of non-diffracting beams;