1) Non-Oriented
无取向
1.
Analysis on Patented Technology of Non-Oriented Electrical Steel Applied in China;
在我国申请的无取向电工钢专利技术的分析
2.
Effect of Normalizing Temperature on Structure and Magnetic Properties of Annealed Non-Oriented Electric Steel;
热轧板常化温度对冷轧无取向电工钢退火组织和磁性能的影响
3.
Effect of Normalizing Temperature of Hot Rolled Plate on Structure and properties of 3.0Si Non-Oriented Electric Steel;
热轧常化温度对3．0%Si无取向电工钢组织和性能的影响
2) disordered orientation
取向无序
3) random orientation
无规取向
4) non-oriented silicon steel
无取向硅钢
1.
Relation between evolution of annealing texture and magnetic property of non-oriented silicon steel;
无取向硅钢退火织构的演变与磁性能关系的研究
2.
Influence of Annealing Temperature on Structure,Texture and Magnetic Properties of Cold Rolled Non-Oriented Silicon Steel;
退火温度对冷轧无取向硅钢组织结构和磁性能的影响
3.
Simulation of Magneto-Crystalline Anisotropy Energy of Cold Rolled Non-Oriented Silicon Steel;
冷轧无取向硅钢的磁晶各向异性能的模拟
5) non-oriented silicon steel sheet
无取向硅钢
1.
Analyze technology main points of low core loss and high magnetic flux density non-oriented silicon steel sheet 35W180,delimited constitute of chemical composition,scheduled production process of excellent in workability,in recyclability,and further in low magnetic field properties,point out the number of inclusions of 0.
分析了高磁感低铁损35W180无取向硅钢板的生产技术要点,界定了材料的成分组成。
2.
Pilot production shows the iron loss of cold-rolled non-oriented silicon steel sheet decreses after calcium treatment, the amount, size distribution and style of microinclusions in nonoriented silicon steel sheet are studied by metalloscope, image analytical meter and scan electron icroscope, the study shows the amount of microinclusions less than 1μm is over 98% and those in range of 0.
用金相显微镜、扫描电镜和图像分析仪检验了硅钢片中微细夹杂物类型及数量、尺寸分布,发现<1μm的微细夹杂物数量占夹杂物总量的98%以上,对无取向硅钢片铁损影响较大的是0。
6) disordered scattering,disorder orientation
无序取向(林)
补充资料：单面取向
分子式：
CAS号：
性质：高分子材料中某种单元(例如分子链轴、晶粒的某一晶轴或某一晶面、纤维状填料的纤维轴或片状填料的片平面)相对于高分子材料的某一特定平面(例如高分子薄膜的膜平面或高分子板材的板平面)择优排列的现象。
CAS号：
性质：高分子材料中某种单元(例如分子链轴、晶粒的某一晶轴或某一晶面、纤维状填料的纤维轴或片状填料的片平面)相对于高分子材料的某一特定平面(例如高分子薄膜的膜平面或高分子板材的板平面)择优排列的现象。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条