The number of layers was increased through slicing-flow changing-combining polymer melts by micro-or nano-layer coextrusion, and the micro-or nano-layer alternative structure was designed.

Monte carlo simulation of the influence of trace impurities on the recrystallization of high purity Al;

Meanwhile, the main trace impurity, a by-product in ethyl 7-chloro-2-oxohepanoate was also separated and analyzed.

Transmission electron microscopy (TEM) has been successfully used to in investigate micro inclusions trapped in synthetic diamond single crystal grown from Fe Ni C system under high temperature and high pressure.