1) multiple scan tree
多扫描树
2) Scan tree
扫描树
1.
The extended compatibilities scan tree techniques can drastically reduce test application time and average power.
尽管扩展相容性扫描树技术可以彻底地降低测试应用时间和平均测试功耗,扫描输出的个数却大大增加。
2.
This paper proposes a novel test response compactor for extended compatibilities scan tree construction based on an XOR-network to reduce the test pins and test response data volume and overcome the error bits diffuse problem at the same time.
在扫描树测试技术中,对相容单元扫描移入相同的测试向量值,可以显著的减少测试应用时间,但是测试需要的引脚数和测试响应数据量增大。
4) multiple-irradiation
多次扫描
1.
Numerical simulation of multiple-irradiation laser bending process of steel plate;
钢板激光多次扫描弯曲成形的数值模拟
2.
Numerical simulation and experimental investigation of multiple-irradiation laser bending process of thick steel plate were presented.
采用数值模拟和实验研究分析了厚钢板激光多次扫描弯曲成形过程中弯曲角度与激光扫描次数之间的关系。
6) Milt-slice scan
多层扫描
补充资料：扫描电子显微镜(见扫描电子显微术)
扫描电子显微镜(见扫描电子显微术)
scanning eleetron mieroseoPe
扫描电子显微镜scanning eleetron mieroseope见扫描电子显微术。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条