We present a method to measure the evanescent field by Michelson interferometer.

Imaging analysis of negative refraction materials to evanescent wave;

This specialized technique specifically illuminates sample with evanescent wave created by total internal reflection, and only a few hundred nanometers depth of sample surface should be excited.

A numerical model is described wherein a probe is modeled using a silver (Ag) particle and the substrate of the sample is modeled using an Ag thin film, in order to compute the near-field enhancement under the excitation of a p-polarized evanescent wave.

Virtual probe is a kind of immaterial tip based on the principle of near-field evanescent wave interference, which can be used in near-field high-density optical data storage, nano-lithography, near-field optical imaging and spectral detection, near-field optical manipulation of nano-scale specimen etc.