1) elliptical polarization technique
椭徧术
2) ellipse technique
椭圆技术
1.
This study adopts active Lamb Wave detection technique to damage detection in composite materials, using ellipse technique in order to localize the two-dimensional damage in structure.
利用压电陶瓷片作为驱动器和传感器,对结构损伤前后的传感信号做信号差,采用3种常用的信号时间延迟估计方法,比较这3种方法计算差信号和健康信号的时间延迟的损伤定位效果,其中定位方法采用了椭圆技术。
3) ellipsometry
[,elip'sɔmitri]
椭偏术
1.
Accurate measurement of its retardation by ellipsometry prove the rationality of its structure design.
椭偏术对其相延测量的实验结果 ,验证了这种波片结构设计的合理性。
4) ellipsometry
[,elip'sɔmitri]
椭偏技术
1.
Research emphasis of the technique of ellipsometry has been transferred to its novel applications in materials analysis from ellipsometry itself which has a histroy of over 100 years,upon the continuously rapid development of computer technology.
随着计算机技术的不断发展，已有一百多年历史的椭偏技术的研究重点已从该技术本身转移到了它在材料分析中的新用途。
5) spectroscopic ellipsometry
椭偏技术
1.
The fractional_dimensional space approach and analysis of spectroscopic ellipsometry are used to study an oxide overlayer effect on the measurement of the parameters of interband critical point (CP) of Si by a Si_SiO 2 model.
运用椭偏技术和分数维空间方法 ,对Si_SiO2 模型考察了表面氧化层的存在对从实验测得的光谱中确定Si临界点跃迁参数的影响 。
6) ellipsometry
[,elip'sɔmitri]
椭偏测量术
1.
To attain high precise optical parameters of thin films,it’s necessary to solve data processing in ellipsometry.
数据处理一直是椭偏测量术获取高精度薄膜结构参数的一个难点。
补充资料：抪徧
1.分布遍及。
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参考词条