This paper fetches the lighting electrical current as accelerating stress under the objective background of Weibull distribution,and carries on the data analysis of a batch of He-Ne laser under accelerated life test with four accelerating stresses.

In order to investigate the effects of helium on the excess point defects and secondary defects processes in low activation Fe-Cr-Mn(W, V) alloys during electron beam and electron-He+ ion dual beam irradiation, the in situ observation was carried out using a high voltage electron microscope connected with an ion accelerator.

Spinel deposited with a thin Au film was implanted with helium ions,and annealed in vacuum condition subsequently.