1) photogenerated leakage current
光生漏电流
1.
When CMOS driver circuit is illuminated by a light, the photogenerated leakage current in the p-n junction is produced, this current reduces the image quality by attenuating the contrast of the LCoS image.
LCoS中像素有源驱动电路受到光照后会在p-n结上产生光生漏电流,而光生漏电流的产生会引起LCoS的图像对比度退化,直接影响其成像质量。
2) stress induced leakage current
应力诱生漏电流
1.
Generation mechanism of stress induced leakage currentin flash memory cell;
闪速存储器中应力诱生漏电流的产生机理
3) Photocurrent
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光生电流
1.
The concentration augmentation of photo-generated free carriers is responsible for the increase of the photocurrent.
光生自由载流子浓度增加是光生电流增强的原因,而自由载流子与三重态激子的相互作用导致了暗电流减弱。
2.
It is found that the output photocurrent of the same piece of solar cell remains constant when the temperature and irradiation are the same and when the diode quality factors and reverse saturation currents are different.
文中通过理论分析与仿真研究,发现同一块太阳能电池在相同的温度和照度、不同的二极管品质因子和反向饱和电流下,输出的光生电流是相等的。
5) optical beam induced current
光感生电流
6) stress induced leakage current(SILC)
应力诱生漏电流(SILC)
补充资料:反向漏电流(inverseleakagecurrent)
反向漏电流(inverseleakagecurrent)
流过处于反向工作的pn结的微小电流称为反向漏电流。理想pn结反向漏电流中还包括体内扩散电流与空间电荷区产生电流两部分,硅pn结空间电荷区产生电流起支配作用。反向漏电流的大小与组成pn结的半导体材料禁带宽度呈指数关系,反向漏电流中还包括表面漏电流,表面漏电流的大小与pn结制作工艺密切相关。
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参考词条