1) thin transparent materials
薄透明体
1.
A handy and simple method is presented for measuring the refractive index of thin transparent materials.
提出了一种比较巧而简便的测量薄透明体的折射率的方法,即利用同一个楔形盒装入两种样品,一为待测样品,另一为易测折射率的透明液体参照物,将楔形盒置于迈克尔逊干涉仪光路中。
2.
At present,the methods of the refractive index of optical materials are many,so a handy and simple method is presented for measuring the refractive index of thin transparent materials.
目前采用干涉法测量光学材料的折射率的方法很多,本文各种方法提出了一种较为巧妙、简便的测量薄透明体折射率的方法,即利用同一个楔形盒装入两种样品,一为待测样品,另一为易测折射率的透明液体参照物,将楔形盒置于迈克尔逊干涉仪光路中利用对比,可较大地简化步骤,减少烦杂计算,从而较快地得到良好结果用此方法测量了某聚合物分散液晶的折射率。
2) Transparent thin-film transistor
透明薄膜晶体管
1.
A novel transparent thin-film transistor was fabricated by rf reactive magnetron sputtering,structure of which was that ITO glass was used as substrate,Al2O3 and AlN as insulator layers were deposited onto it successively,and then active layer ZnO film was deposited onto the Al2O3/AlN compound substrate,Al was used as source and drain electrodes.
采用射频反应磁控溅射的方法,以ITO(铟锡氧化物)玻璃为衬底,在Al2O3/AlN复合栅极绝缘层上沉积有源层ZnO薄膜,并以Al作为透明薄膜晶体管器件源极和漏极,通过XRD、透射光谱研究了透明薄膜晶体管的有源层ZnO的结晶情况以及对器件在可见光范围内的透过特性的影响,得出以Al2O3/AlN为复合缓冲层薄膜晶体管,在400℃温度下退火处理后,ZnO有源层有较好的c-axis(002)择优取向,器件在可见光的范围内整体透过率在88%以上,从而实现了ZnO-TFT器件在可见光范围内的透明。
3) thickness of thin transparency
薄透明体厚度
1.
The refractive index and thickness of thin transparency measuredby Michelson interferometer;
迈克耳孙干涉仪测薄透明体厚度和折射率
4) transparent semiconductive films
透明半导体薄膜
5) transparent film
透明薄膜
1.
Correlogram peak separate algorithms of transparent film;
透明薄膜的干涉相干峰分离算法
2.
Method of measuring refractive index of transparent film;
一种测量透明薄膜折射率的方法
6) transparent thin film
透明薄膜
1.
The interference microscope has been applied to the measurement of the transparent thin film thickness, thus the measurement range and the application field of the interference microscope have been expanded.
将干涉显微镜的应用推广到透明薄膜厚度的测量,扩展了干涉显微镜的测量范围和应用领域。
补充资料：透明体
1.能透过光线的物体。如水﹑玻璃﹑水晶等。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条