说明：双击或选中下面任意单词，将显示该词的音标、读音、翻译等；选中中文或多个词，将显示翻译。
您的位置：首页 -> 词典 -> 全貌测量
1)  whole-profile measurement
全貌测量
例句>>
2)  Topography measurement
形貌测量
1.
Digital holography is a technology that has characteristics of simple and convenient measurement, non-contact, high resolution in topography measurement of 3D object’s surface, and has a wide perspective in application.
数字全息技术用于物体表面三维形貌测量具有测量简便、快捷、无接触、高分辨率的特点,有着广阔的应用前景。
更多例句>>
3)  profile measurement
形貌测量
1.
The latest development of optical non-contact 3D profile measurement;
光学非接触三维形貌测量技术新进展
2.
Application of generalized B spline filter to surface profile measurement;
广义B样条滤波器在表面形貌测量中的应用
3.
The 3D profile measurement technology has widely application and promising future in fields of industrial online inspection, robotic vision, biomedicine etc.
物体的三维形貌测量在工业检测、机器视觉、医学等众多领域有着广泛的应用。
更多例句>>
4)  topography measurement
地貌测量
1.
To effectively realize the image feature matching for topography measurement and rebuilding,a new matching scheme is presented,where the topography resource image and model image matched are partitioned at first,and then the regions are matched according to the gray level correlation.
针对地貌测量重构中的图像特征匹配问题,提出了一种新的图像特征匹配方法。
2.
To effectively realize the camera calibration on a position topography measurement, a multi-camera parallel calibration method is proposed based on a camera intrinsic parameter model.
针对阵地地貌测量重构中的相机参数标定问题,基于相机的内参数模型提出了一种多相机并联阵地地貌测量标定方法。
5)  Shape measurement
形貌测量
1.
Analysis of the shape measurement by carrier modulation in electronic speckle pattern interferometry
电子散斑干涉载频调制形貌测量方法的分析
2.
A shape measurement based on electronic speckle pattern interferometry(ESPI)by carrier modulation is presented.
用摄像机采集该载波条纹图,利用傅里叶变换法可解调出物体高度的位相信息,从而实现物体的形貌测量。
3.
A method of shape measurement based on ESPI carrierfrequency modulation is presented.
用CCD采集该载波条纹图,利用傅里叶变换法可解调出物体高度的位相信息,从而实现物体的形貌测量。
更多例句>>
6)  Micro profile testing
微形貌测量
补充资料：全貌
1.事物的全部面貌，全部情况。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条