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1)  Energy dispersive X-ray powder diffraction
能量色散X射线粉末衍射
1.
Energy dispersive X-ray powder diffraction (EDXD) of natural chromium-bearing spinel collected from Damapin using synchrotron radiation has been in situ measured under high pressure(0—12.
82GPa条件下,在中国科学院高能物理研究所同步辐射实验室高压站,利用外加温金刚石压腔装置(DAC),进行了能量色散X射线粉末衍射(EDXD)原位测量,获得了天然含Cr尖晶石随压力和温度变化的衍射图谱。
2)  energy dispersive X-ray diffraction(EDXD)
能量色散X射线粉末衍射(EDXD)
3)  EDXRD (Energy dispersive X-ray diffraction)
能量色散X射线衍射
4)  X-ray powder diffraction
X射线粉末衍射
1.
Identification of unknown solid chemical reagents by X-ray powder diffraction;
X射线粉末衍射法鉴定无标签化学试剂
2.
The structure of GdVO4 crystal was studied by X-ray powder diffraction method at room temperature,and the results confirmed that GdVO4 single crystal was tetragonal and belong to D194h-I41/amd space group.
室温下测量了GdVO4晶体的X射线粉末衍射图,确定所获GdVO4晶体属于四方晶系,D149h-I41/amd空间群。
3.
Its structure was characterized by X-ray powder diffraction,elemental analysis,high performance liquid chromatography,and differential scan calorimetry.
发现了那格列奈的一种新晶型(命名为X2),并用X射线粉末衍射分析仪、元素分析仪、高效液相色谱仪、差示扫描量热仪对其进行了测定,给出了相关的图谱与数据。
5)  X-ray powder diffraction
X-射线粉末衍射
1.
X-ray powder diffraction patterns of PDBT and FDBT were obtained and the strongest lines expressed by Hanawalt method.
并得到了其X-射线粉末衍射图谱,最强线用Hanawalt法表示。
2.
The single crystals structure were investigated by X-ray powder diffraction (XRPD) experiments.
用提拉法成功地生长了具有La3Ga5SiO14(LGS)结构的A3BGa3Si2O14(A=Ca,Sr;B=Nb,Ta)系列单晶;用X-射线粉末衍射证明了其单晶结构,并在200~3200nm间测其透过谱。
3.
The mineralogy of the brucite in Dongqin brucite mine was studied by using electronic microscope and X-ray powder diffraction,and the behavior mineral property of the brucite was determined.
通过运用电子显微镜镜下鉴定、X-射线粉末衍射等方法对辽宁省岫岩东秦水镁石矿的矿石进行了基础性矿物学研究,发现岫岩东秦水镁矿的矿石属于青绿色纤维状集合体,其纯度较高,属于杂质很少的优质纤维,具有很高的开采开发价值。
6)  X ray powder diffraction
X射线粉末衍射
1.
Phase relationship of the pseudo binary LaB 3O 6 CaB 4O 7 system was investigated by means of X ray powder diffraction analysis and differential thermal analysis.
本文通过X射线粉末衍射和差热分析等方法研究了LaB3 O6 CaB4O7赝二元体系相图。
补充资料:能量色散X射线荧光光谱法
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性质:根据元素辐射X射线荧光光子能量不同,经探测器接收后,用脉冲高度分析器区域,进行元素的鉴定;根据分析线脉冲高度分布的积分强度,进行元素定量的分析方法。适用于原子序数6(碳)以上各元素的分析。灵敏度和精密度和比波长色散X射线荧光光谱法低一个数量级。仪器使用简单,所发射分析线强度利用率高,全部X射线光谱强度可同时累积,便于显示。

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