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1)  frequency mapping
频率映射
2)  stroboscopic map
频闪映射
1.
A stroboscopic map for voltage-controlled single ended primary inductor converters (SEPIC) with pulse width modulation (PWM) is presented, where the low-frequency oscillating phenomena such as quasi-periodic bifurcation and phase locking limit circle occurring in the system are captured by mathematical and experimental methods.
导出了电压型SEPIC变换器的频闪映射方程,采用数值模拟、非线性动力学理论分析和电路实验的方法研究了系统中的低频不稳定现象,并对不稳定区域中的非线性行为(如准周期分岔、锁相极限环)进行了分析,揭示了低频振荡的特征、振荡周期的变化规律及低频振荡产生的物理机理。
2.
Stroboscopic maps are derived to describe precisely the nonlinear dynamical characteristics of Boost PFC converters under peak-current control mode.
该文推导出了一组频闪映射方程来精确描述峰值电流控制型 Boost PFC 变换器的非线性动力学特性。
3.
Conditions for stability are established through the stroboscopic map and Jury inequalities.
考虑一个具常数脉冲出生的 L otka- Volterra捕食 -食饵系统 ,并利用频闪映射及 Jury判定证明该系统的稳定性 ,拓展了传统的 L otka- Volterra捕食 -食饵模型 。
3)  spectrum mapping
频谱映射
1.
Any A/D sampling is a spectrum mapping from the original signal to bandpass sampled signal.
文章建立了对任意A/D采样(包括欠采样与过采样)都有效的频谱映射一般公式,提出无混迭带通A/D采样速率f_s的2个等效准则,以便在随信号调整f_s情况下的应用。
4)  mapping efficiency
映射效率
5)  Rate mapping
速率映射
6)  RF frequency
射频频率
1.
SiNx thin films were deposited by Plasma-Enhanced Chemical Vapor Deposition (PECVD) methodunder different RF frequency, and the influence of RF frequency on both the deposition process andproperties of the SiNx film were studied.
用PECVD方法制备氮化硅薄膜,研究了射频频率对氮化硅薄膜的沉积和性质的影响。
补充资料:频率计量(见时间频率计量)


频率计量(见时间频率计量)
frequency metrology: see time and frequency metrology

  口n IQ liliang顷率频率计皿(f比quency metrolo盯) 计t。见时闰
  
说明:补充资料仅用于学习参考,请勿用于其它任何用途。
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