1) tuning-fork shear-force microscope(TSM)
调谐音叉剪切力显微镜(TSM)
2) shear force microscope
剪切力显微镜
1.
Contact mode atomic force microscope (AFM),friction force microscope (FFM),and shear force microscope (SFM) were used to map the patterns.
考察了膜的表面性质对接触式原子力显微镜（ＡＦＭ），摩擦力显微镜（ＦＦＭ）和剪切力显微镜（ＳＦＭ）的成像的影响。
3) tuned fork MEMS gyro
音叉调谐微机械陀螺仪
4) light section microscope
光切显微镜
1.
The image extraction system of light section microscope is reformed.
改装了光切显微镜图像提取系统 ,采用数字摄像头摄取表面轮廓图像 ,通过图像处理 ,可提取被测表面的二维轮廓曲线 ,计算出多种表面粗糙度参数值 ,并可打印图形和相关报表。
2.
The paper presents a surface roughness measurement system which is based on light section principle and consists of conventional light section microscope and CCD camera as well as image processing software.
以光切法的测量原理为基础,应用传统双管光切显微镜、CCD摄像装置、虚拟仪器及图像处理技术开发了表面粗糙度检测系统。
5) piezo-electric quartz fork
石英调谐音叉
1.
The distance between tip and sample(T-S) can be regulated using piezo-electric quartz fork glued with micro optic fiber probe.
利用粘有光纤探针的石英调谐音叉,可实现近场扫描光学显微镜(NSOM)和调谐音叉剪切力显微镜(TSM)光纤探针尖端与样品(T-S)间距离的控制。
6) focusing microscope
调焦显微镜
补充资料：显微镜19世纪中期的显微镜
[图]
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条