1) x-ray spectrum interference
X-射线谱线干扰
3) X-ray spectrum
X射线谱
1.
This paper mostly discusses a kind of new type electric refrigeration semiconductor detector that measures X-ray, and its application in X-ray spectrum analysis.
介绍了一种测量X射线的Si-PIN电制冷半导体探测器,以及它在X射线谱分析中的应用。
2.
We investigate the X-ray spectrum of two-temperature accretion disk and consider the effects of thermal electron and positron pair production upon the structure and spectrum of accretion disk.
这种盘的光子辐射谱是幂律的与一些天体 X射线谱的观测相似。
3.
The resulti show that, for stronger X-ray spectrum (15 keV Planck spectrum), Compton scattercan cause the depositional energy and the peak pressur of X-ray shock wave to decrease, in LY-12 aluminium, the disagreement aE(x) /E(x) range from 9 % to 22 %, △Pm(x) /Pm(x) is about 12 %.
计算结果表明，对较硬的X射线谱（15heVPlanck谱），康普顿散射造成能量沉积与热击波峰压明显下降，在LY－12铝中，能量沉积的相对差△E（X）／E（X）可达9％～22％，热击波峰压的相对差△Pm（X）／Pm（X）约为12％。
4) X-rayspectrum
X-射线谱
5) EDS
X射线能谱
1.
Before and after treatment,the surface structure of JB-1 explosive was observed by scanning electron microscope (SEM),and its element concentration was analyzed by X-ray energy spectrum (EDS).
对以TATB为基的高聚物粘结炸药(JB1)进行了超声空化处理,并利用扫描电镜(SEM)观察了处理前后JB1炸药表面的细观形貌,用X射线能谱仪(EDS)检测了处理前后JB1炸药表面的相对元素含量。
2.
The mineralogical and petrological characteristics of the "glimmering" jadeite jade samples,which are of high value in the jewelry market at present,are studied by using X-ray powder diffraction(XRD),Fourier transform infrared spectroscopy(FTIR),X-ray energy dispersive spectrometer(EDS) and scanning electron microscopy(SEM).
采用X射线粉末衍射仪(XRD)、傅里叶变换红外光谱仪(FTIR)、X射线能谱仪(EDS)和扫描电子显微镜(SEM)等测试仪器对目前珠宝市场价值较高的"起荧"翡翠样品进行了矿物学、岩石学研究,并对其"起荧"现象的光学原理进行了初步探讨。
6) X-ray energy spectrum
X射线能谱
1.
X-ray energy spectrum analysis of wild and artificial Gastrodiae;
野生和人工栽培天麻的X射线能谱分析
2.
By using scanning electron microscope and X-ray energy spectrum,the common trace elements,S,P,Ca,K,Fe,Cu and Zn contents in the pileus peel,context,and lamella were detected.
利用扫描电镜和X射线能谱仪对姬松茸菌株J3与原菌株J1子实体的菌盖皮、菌盖内和菌褶中常见的微量元素S、P、Ca、K、Fe、Cu和Zn进行了测定,计算了它们的相对重量百分比。
补充资料：谱线干扰
分子式：
CAS号：
性质：待测元素分析线上有其他元素谱线重叠或部分重叠，导致分析结果产生误差，或该分析线无法用于光谱分析。有三种情况：分析线与干扰线波长基本相同，谱线完全重叠；分析线与干扰线波长相近，谱线部分重叠；分析线落在带状光谱上。采用色散率及分辨率高的摄谱仪，可减小或消除谱线干扰。
CAS号：
性质：待测元素分析线上有其他元素谱线重叠或部分重叠，导致分析结果产生误差，或该分析线无法用于光谱分析。有三种情况：分析线与干扰线波长基本相同，谱线完全重叠；分析线与干扰线波长相近，谱线部分重叠；分析线落在带状光谱上。采用色散率及分辨率高的摄谱仪，可减小或消除谱线干扰。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条