1) X-ray excited optical luminescence
X射线激发发光谱
1.
X-ray absorption fine structures(XAFS)and X-ray excited optical luminescence(XEOL)at the Si K and Si L3,2 edge have been used to investigate the optoelectronic properties of Silicon nanowires.
采用X射线吸收精细结构谱(XAFS)和X射线激发发光谱(XEOL),在Si的K边和L3,2边研究了硅纳米线的光电特性。
2) X-ray excited emission spectra
X射线激发发射光谱
3) x-ray excited luminescence spectrum
X射线激发发光光谱
1.
The doping ions improve the transmittance and the x-ray excited luminescence spectrum intensity.
掺杂的离子改善了晶体的透过率和X射线激发发光光谱强度。
4) Particle induced X-ray emission spectrometry
粒子激发X射线光谱
5) Proton induced X-ray emission spectrometry
质子激发X射线光谱
6) XEL
X射线激发发光
1.
Highly luminescent ZnS∶Au,Cu X-ray phosphor fine particles synthesized by hydrothermal method is reported for the first time and its photoluminescence (PL) and X-ray excited luminescence (XEL) properties were studied in detail.
报道了水热法合成的高强度ZnS∶Au,Cu超细X射线发光粉及其光致发光(PL)和X射线激发发光(XEL)的光谱特性。
补充资料:粒子激发X射线分析
分子式:
CAS号:
性质:用带电粒子(例如质子、α粒子、重离子等)激发待测元素,随后探测其退激时发射出的特征X射线的分析方法。其中应用最广的是质子激发X射线发射分析。
CAS号:
性质:用带电粒子(例如质子、α粒子、重离子等)激发待测元素,随后探测其退激时发射出的特征X射线的分析方法。其中应用最广的是质子激发X射线发射分析。
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参考词条