1) dielectric spectroscopy
介电谱
1.
Numerical simulation of the dielectric spectroscopy of multi-layer composite systems
层状复合体系介电谱的数值模拟
2.
Study of intrinsic defects in ZnO varistor ceramics by dielectric spectroscopy
ZnO压敏陶瓷中缺陷的介电谱研究
3.
The validity for investigating membrane-solution systems by using dielectric spectroscopy was logically demonstrated.
就“介电谱方法研究膜体系的有效性”这一问题进行了展开性的阐述:扼要地介绍了以等效回路为基础的膜-液体系基本介电模型和包含电性质分布区域的多层膜介电模型,并以纳滤膜体系为例简要论证了以该模型和介电理论为基础的介电谱解析方法对原位获取内部信息的有效性。
2) dielectric spectrum
介电谱
1.
Development of temperature monitoring and dielectric spectrum measurement system based on LabVIEW;
基于LabVIEW的温度监控与介电谱测试系统研制
2.
The experimental data of the dielectric spectrum of water has been fitted to a theoretical formula with which the correlation function is calculated.
将水的介电谱实验数据拟合进而得到介电常数理论公式,并基于此计算了相关函数。
3.
74) ceramics were prepared by conventional solid state reaction method,and the dielectric spectrum of BST ceramics in broad frequencies was measured.
测量了样品的宽频段介电谱,发现钛酸锶钡的超低频介电谱在复介电常数平面上给出一段圆弧;但是,在高于5 Hz时偏离圆弧组成一段直线。
3) dielectric spectra
介电谱
1.
In this paper thin glass is strengthened in two kinds of liquid and measurement method of dielectric spectra on the toughened glass is presented so as to study the relationship between dielectric behavior and strength of the tempered glass.
采用双液法钢化薄玻璃,并提出玻璃表面介电谱测量法。
2.
The dielectric spectra of undecatungstogalloindic acid with solid film under different temperatures are investigated over the broad frequency region 40Hz-110MH,and two dielectric relaxations were found.
11H2O在40Hz-110MHz频率范围的介电谱,发现这些谱都是由两个弛豫过程表征的,分别是由于材料内部粒子表面对离子电荷移动和粒子间界面极化产生的。
4) C-T and tgδ-T
介电温谱
1.
The curves of C-T and tgδ-T for th.
介电温谱测试表明,随着温度的升高,梯度薄膜出现一个铁电-铁电相变点和两个居里点,同时出现一定的频率弥散现象。
5) dielectric frequency spectra
介电频谱
1.
In this paper, dielectric frequency spectra are investigated at 1kHz～3.
0 GHz范围内研究了 Pb Ti O3基陶瓷的介电频谱 ,给出了此种陶瓷在高频和超高频以及微波频率领域中应用的一些重要信息。
2.
In this paper,the dielectric frequency spectra of SrTiO3Nd2O3 system ceramics is investigated.
研究SrTiO3-Nd2O3系陶瓷的介电频谱特性。
6) dielectric spectrum
介电光谱
1.
It is found that:(1) the reflective index is firstly enhanced and then reduced with the increase of incident wavelength,and the reflective spectrum exhibits a tendency of collapse with the increase of porosity;(2) the porous silicon dielectric spectrum is bmue-shifted and the real and imaginary parts are reduced with the increase of.
采用改进过的Maxwell-Garnett模型研究了入射光波长和多孔硅的孔隙率对反射光谱和介电光谱的影响,结果表明:(1)随着入射光波长的增大,多孔硅的反射率先增大后减小,而随着孔隙率的增大反射光谱出现了明显的下塌趋势,且孔隙率越大下塌得越明显;(2)随着孔隙率的增加,多孔硅复介电光谱出现明显的蓝移现象,且多孔硅有效介电常数的实部和虚部均变小。
2.
It was found that (1) the reflection index was enhanced first and then reduced with increasing incidence wavelength and the reflection spectrum emerged a tendency of collapse with increasing porosity, and (2) the porous silicon dielectric spectrum was blue-shifted and the real part and imaginary part reduced with increasing porosity.
采用改进过的Maxwell-Gamett模型研究了入射光波长和多孔硅的孔隙率对反射光谱和介电光谱的影响,结果表明:(1)随着入射光波长的增大,多孔硅的反射率先增大后减小,而随着孔隙率的增大反射光谱出现了明显的下榻趋势,且孔隙率越大下榻得越明显;(2)随着孔隙率的增加,多孔硅复介电光谱出现明显的蓝移现象,且多孔硅有效介电常数的实部和虚部均变小。
补充资料：介电谱
分子式：
CAS号：
性质： 对介电质加一电场，在宽范围的温度和频率内描述介电常数和介质损耗因数变化的曲线，即复数介电常数的实数部分ε′(ω)频谱和虚部ε"(ω)频谱，也称作介电色散曲线。介电谱可以给出有关极化机制和晶格振动等重要信息，有两种类型介电谱，即共振型和松弛型。介电谱对研究材料的频率特性及相变特性有重要意义。
CAS号：
性质： 对介电质加一电场，在宽范围的温度和频率内描述介电常数和介质损耗因数变化的曲线，即复数介电常数的实数部分ε′(ω)频谱和虚部ε"(ω)频谱，也称作介电色散曲线。介电谱可以给出有关极化机制和晶格振动等重要信息，有两种类型介电谱，即共振型和松弛型。介电谱对研究材料的频率特性及相变特性有重要意义。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条